Visualizing Graphene Based Sheets by Fluorescence Quenching Microscopy

Jaemyung Kim,Laura J. Cote,Franklin Kim,Jiaxing Huang

DOI: https://doi.org/10.1021/ja906730d

2009-12-15

Abstract:Graphene based sheets have stimulated great interest due to their superior mechanical, electrical and thermal properties. A general visualization method that allows quick observation of these single atomic layers would be highly desirable as it can greatly facilitate sample evaluation and manipulation, and provide immediate feedback to improve synthesis and processing strategies. Here we report that graphene based sheets can be made highly visible under a fluorescence microscope by quenching the emission from a dye coating, which can be conveniently removed afterwards by rinsing without disrupting the sheets. Current imaging techniques for graphene based sheets rely on the use of special substrates. In contrast, the fluorescence quenching mechanism is no longer limited by the types of substrates. Graphene, reduced graphene oxide, or even graphene oxide sheets deposited on arbitrary substrates can now be readily visualized by eye with good contrast for layer counting. Direct observation of suspended sheets in solution was also demonstrated. The fluorescence quenching microscopy offers unprecedented imaging flexibility and could become a general tool for characterizing graphene based materials.

Materials Science

What problem does this paper attempt to address?

The problem that this paper attempts to solve is to develop a general and efficient visualization method for observing the single - atom - layer structures of graphene - based materials (such as graphene, reduced graphene oxide, and graphene oxide). Existing imaging techniques usually rely on special substrate materials, which greatly restricts the research and application of these two - dimensional materials.

Specifically, the paper aims to solve the following problems:

1. **Limitations of substrate materials**: Current imaging techniques (such as atomic force microscopy (AFM), scanning electron microscopy (SEM), etc.) require specific types of substrate materials, such as freshly cleaved mica or silicon wafers, which makes it difficult to observe graphene - based materials on arbitrary substrates.

2. **Requirement for high - throughput sample evaluation**: In order to study the influence of solution - processing methods on the quality of graphene films, researchers need to quickly evaluate the microstructure of samples, including flake - size distribution, coverage, wrinkling, and overlapping degree, etc. Existing techniques are difficult to meet this requirement.

3. **Direct observation of graphene - based materials suspended in solution**: Existing imaging techniques cannot directly observe graphene - based materials in solution, which is very important for studying their dynamic behaviors.

To solve these problems, the paper proposes a new method based on fluorescence quenching microscopy (FQM). By coating a layer of fluorescent dye on the graphene - based materials and using the fluorescence quenching effect of the graphene - based materials, high - contrast visualization can be achieved on any substrate. In addition, FQM can also be used to directly observe graphene - based materials suspended in solution, providing unprecedented imaging flexibility.

In summary, the goal of this paper is to develop an efficient visualization method that is not limited by the substrate type and is applicable to any substrate, so as to promote the research and application of graphene - based materials.