X-Ray Photoelectron Spectroscopy Study of Synchrotron Radiation Irradiation of a Polytetrafluoroethylene Surface

Yuichi Haruyama,Tomoya Ideta,Hiroyuki Ishigaki,Kazuhiro Kanda,Shinji Matsui
DOI: https://doi.org/10.1143/jjap.42.1722
IF: 1.5
2003-04-15
Japanese Journal of Applied Physics
Abstract:The effect of synchrotron radiation (SR) irradiation of a polytetrafluoroethylene (PTFE) surface was investigated using X-ray photoelectron spectroscopy (XPS). After the SR irradiation, the relative intensity of the F 1s peak to the C 1s peak decreased markedly. The chemical composition ratio of the F atoms to C atoms was estimated to be 0.29. From the curve fitting analysis of C 1s and F 1s XPS spectra, the chemical components and their intensity ratio were determined. The reason for the chemical composition change by the SR irradiation was discussed.
physics, applied
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