Abstract:We study the phase transition of thin films in the three-dimensional XY universality class. To this end, we perform a Monte Carlo study of the improved two-component \phi^4 model, the improved dynamically diluted XY model and the standard XY model on the simple cubic lattice. We study films of a thickness up to L_0=32 lattice spacings. In the short direction of the lattice free boundary conditions are employed. Using a finite size scaling (FSS) method, proposed recently, we determine the transition temperature with high accuracy. The effectively two-dimensional finite size scaling behaviour of the Binder cumulant U_4, the second moment correlation length over the lattice size \xi_{2nd}/L, the ratio of the partition functions with anti-periodic and periodic boundary conditions Z_a/Z_p and the helicity modulus \Upsilon clearly confirm the Kosterlitz-Thouless nature of the transition. We analyse the scaling of the transition temperature with the thickness L_0 of the film. The predictions of the renormalization group (RG) theory are confirmed. We compute the universal ratio of the thickness of the film L_0 and the transversal correlation length \xi_T in the three-dimensional thermodynamic limit at the Kosterlitz-Thouless transition temperature of a film of thickness L_0: [L_{0,KT}/\xi_T]^* = 1.595(7). This results can be compared with experimental results on thin films of 4He near the \lambda-transition.
What problem does this paper attempt to address?
This paper aims to study the phase - transition behavior of thin films in the three - dimensional XY universality class, especially the Kosterlitz - Thouless (KT) phase transition. Specifically, the authors studied the performance of the improved two - dimensional φ4 model, the improved dynamic dilution XY model and the standard XY model on a simple cubic lattice through Monte Carlo simulations. The research object is a thin film with a thickness reaching \( L_0 = 32 \) lattice spacings, and the finite - size scaling (FSS) method is used to determine the transition temperature.
### Main problems
1. **Verification of KT phase transition**: The authors attempted to verify whether the phase transition in the thin film is a KT phase transition. To this end, they analyzed the Binder cumulant \( U_4 \), the ratio of the second - moment correlation length to the lattice size \( \xi_{2nd}/L \), the ratio of the partition function under anti - periodic and periodic boundary conditions \( Z_a/Z_p \) and the helicity modulus \( \Upsilon \). The behavior of these quantities clearly confirms the nature of the KT phase transition.
2. **Relationship between transition temperature and thickness**: The authors studied the variation law of the transition temperature with the film thickness \( L_0 \) and verified the prediction of the renormalization group (RG) theory. They calculated the ratio of the film thickness \( L_0 \) to the transverse correlation length \( \xi_T \) at the KT transition temperature and obtained a universal ratio:
\[
[L_0, KT / \xi_T]^* = 1.595(7)
\]
This result can be compared with the observation results of thin helium films (such as \(^4He\)) near the λ - phase transition in experiments.
### Research background
Near the second - order phase transition, the correlation length diverges and satisfies the following relationship:
\[
\xi \simeq f_\pm |t|^{-\nu}
\]
where \( t=(T - T_c)/T_c \) is the normalized temperature, \( f_+ \) and \( f_- \) are the amplitudes of the high - temperature and low - temperature phases respectively, and \( \nu \) is the critical exponent of the correlation length. In addition, other physical quantities such as specific heat also follow power - law behavior:
\[
C \simeq A_\pm |t|^{-\alpha}+B
\]
where \( B \) is the analytic background term, and for the three - dimensional XY universality class, the critical exponent \( \alpha \) of the specific heat is negative.
### Comparison between experiment and theory
Experimentally, especially under microgravity conditions, the λ - phase transition of helium - 4 (\( ^4He \)) provides the most accurate critical exponents and amplitude ratios. For example, the specific heat is measured at a very small normalized temperature \( t\approx5\times 10^{-10} \), obtaining \( \alpha = - 0.0127(3) \), corresponding to \( \nu = 0.6709(1) \). These experimental results are highly consistent with theoretical predictions.
### Influence of film geometry
When the system has a finite extension in one direction, its behavior will change significantly. For film geometry (i.e., one direction is finite and the other two directions are infinite), the system exhibits two - dimensional characteristics near the transition, so a KT phase transition is expected to occur. Finite - size scaling theory predicts that near the transition temperature, the physical behavior of the system is determined by \( L_0/\xi \), and thin films of different thicknesses have the same phase - transition behavior at the same \( L_0/\xi \).
### Conclusion
Through detailed Monte Carlo simulations and finite - size scaling analysis, this paper successfully verifies the existence of the KT phase transition in thin films and provides a universal relationship between film thickness and correlation length, providing an important basis for further understanding the phase - transition behavior of thin - film systems.