Utilizing cluster percolation theory to analyze electrical resistivity jumps in high-entropy alloy thin films containing small atoms

Xiao Wang,Xiaona Li,Zhumin Li,Yuehong Zheng,Chuang Dong,Peter K. Liaw
DOI: https://doi.org/10.1016/j.scriptamat.2023.115727
IF: 6.302
2023-09-06
Scripta Materialia
Abstract:The high-entropy alloy thin films (HEATFs) with non-metal small atoms have obvious characteristics of adjustable properties. However, the mismatch phenomenon of phase-transition and electrical resistivity jump usually occur during the interstitial-filling. To explain this phenomenon, a new method is proposed that transforms the multi-color percolation of HEATFs to two-color percolation. The [N/O-M 6 ] clusters with high electrical resistivity and [▫-M 6 ] clusters with low electrical resistivity in (NbMoTaW) 100- x N x and (NbMoTaWV) 100- x O x films are equivalent to black and white spheres, respectively (M and ▫ ▫-M 6 ]) reaches the face-centered-cubic and amorphous percolation thresholds of 0.198 and 0.27, respectively, a conductive percolation path is formed, contributing to a significant reduction in electrical resistivity. This work enables it possible to predict the composition at sudden change in electrical resistivity of HEATFs with non-metallic small atoms, which has great significance for the functional composition design.
materials science, multidisciplinary,nanoscience & nanotechnology,metallurgy & metallurgical engineering
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