Probing Thermal-induced Phonon Energy Shift of SiC in Nanoscale by in Situ Vibrational Spectroscopy
Xingxu Yan,Chengyan Liu,Chaitanya A. Gadre,Ruqian Wu,Xiaoqing Pan
DOI: https://doi.org/10.1017/s1431927619003842
IF: 4.0991
2019-01-01
Microscopy and Microanalysis
Abstract:Journal Article Probing Thermal-induced Phonon Energy Shift of SiC in Nanoscale by in situ Vibrational Spectroscopy Get access Xingxu Yan, Xingxu Yan Department of Materials Science and Engineering, University of California - Irvine, Irvine, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Chengyan Liu, Chengyan Liu Department of Materials Science and Engineering, University of California - Irvine, Irvine, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Chaitanya A Gadre, Chaitanya A Gadre Department of Physics and Astronomy, University of California - Irvine, Irvine, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Ruqian Wu, Ruqian Wu Department of Physics and Astronomy, University of California - Irvine, Irvine, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Xiaoqing Pan Xiaoqing Pan Department of Materials Science and Engineering, University of California - Irvine, Irvine, CA, USADepartment of Physics and Astronomy, University of California - Irvine, Irvine, CA, USAIrvine Materials Research Institute (IMRI), University of California - Irvine, Irvine, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 622–623, https://doi.org/10.1017/S1431927619003842 Published: 01 August 2019