Material and thickness selection of dielectrics for high transmittance terahertz window and metasurface

Jiaming Liu,Wen Lyu,Xiaojiao Deng,Yingxin Wang,Hua Geng,Xiaoping Zheng

DOI: https://doi.org/10.1016/j.optmat.2022.112219

IF: 3.754

2022-05-01

Optical Materials

Abstract:Dielectric materials, commonly used in conventional terahertz devices, are applied in all-dielectric metasurfaces for many functional applications in recent years. Various measurement systems, including time-domain spectrometer (TDS), vector network analyzer (VNA) and Fourier transform infrared (FTIR) spectrometer, have been used to analyze the dielectric properties of common materials in terahertz region. However, only the influence of thickness or Fabry-Perot (FP) term on transmittance under a specified incident angle was considered. In this paper, the influences of refractive index, absorption coefficient and thickness on the extrema and fluctuation period of transmittance spectra are systematically analyzed for the first time. Moreover, the transmittance spectra of four plates, which are two different thicknesses of each TPX and HDPE material, were measured by 3 THz systems. These three systems are frequency multiplication chain (FMC), VNA and TDS which are corresponding to direct and coherent detection methods by electronic, and optical coherent detection method. For each plate, the transmittance spectra measured by three systems have been compared, which can obtain the average error of each system. These measurement results are in good agreement with the theoretical calculation values. The electronic coherent detection technique shows half of the test error compared with the other two techniques. The criteria for dielectrics selection proposed in this paper can provide some guidance for the selection of suitable material and thickness of high transmittance windows and the substrate of dielectric metasurfaces.

materials science, multidisciplinary,optics