Y. J. Wang,Ophelia K. C. Tsui
Abstract:We study the temporal growth pattern of surface fluctuations on a series of spinodally unstable polymer films where the degree of instability is controlled by the film thickness. For films in the deep spinodal region, the growth rate function of the surface modes as a function of the wavevector,, fits well to the mean-field theory. As the film thickness is increased and the film instability decreases, the mean-field theory demonstrates marked disagreement with experiment, notwithstanding provision of the known corrections for random thermal noise. We show that the deviations arise from large-amplitude fluctuations induced by homogeneous nucleation, which has not been considered in conventional treatment of thermal noise.
What problem does this paper attempt to address?
This paper aims to study the time - growth patterns of surface fluctuations of a series of polymer films in a spinodal - unstable state, where the instability of the films is controlled by the film thickness. For films in the deep spinodal region, the growth rate function \(\Gamma(q)\) of the surface mode is consistent with the mean - field theory prediction. However, as the film thickness increases and the film instability weakens, significant differences between the experimental results and the mean - field theory emerge, even when considering the known correction for random thermal noise. The study points out that this deviation stems from large - scale fluctuations caused by homogeneous nucleation, which is not considered in the traditional methods for dealing with thermal noise.
Specifically, the paper explores how thermal fluctuations affect the spinodal growth of the order parameter in a two - dimensional (2D, far below the upper critical dimension) unstable system. The research object is polystyrene (PS) deposited on silicon covered with a 106 - nm - thick SiOx layer. The paper describes the results of PS films with different thicknesses (3 nm, 5.5 nm, and 11 nm), which are located in the deep spinodal region, the intermediate spinodal region, and the marginal spinodal region respectively. The value of \(\Gamma(q)\) can be determined by analyzing the time - developed radially - averaged Fourier amplitudes at different wave vectors \(q\).
It is found that for thinner films (such as 3 nm), the surface fluctuations in the early rupture stage are correlated, which is confirmed by the ring - like structures in the 2D Fourier spectrogram and the development of spectral peaks. For thicker films (such as 5.5 nm and 11 nm), phenomena inconsistent with the mean - field theory are observed, especially the turning point in the increase of the maximum amplitude \(A_{\text{max}}\) with time, which is considered to be due to thermal nucleation. Through detailed experimental data and theoretical analysis, the paper reveals the influence of thermal fluctuations on the spinodal decomposition dynamics, especially the abnormal phenomena observed in thicker films, and proposes thermal nucleation as a mechanism to explain these abnormal phenomena.