Patterns of energy-dependent variability from Comptonization

Marek Gierlinski,Andrzej A. Zdziarski
DOI: https://doi.org/10.1111/j.1365-2966.2005.09527.x
2005-08-23
Abstract:We study fractional variability as a function of energy from black-hole X-ray binaries on timescales from milliseconds to hundreds of seconds. We build a theoretical model of energy-dependent variability in which the X-ray energy spectrum varies in response to a changing physical parameter. We compare these models to rms spectra obtained from RXTE PCA observations of black-hole binaries XTE J1550-564 and XTE J1650-500. We show that two main variability models are consistent with the data: variable seed photon input in the hard state and variable power in the Comptonized component in the soft and very high states. The lack of clear reflection features in the rms spectra implies that the reflection and the X-ray continuum, when integrated over Fourier frequencies, are correlated and vary with similar fractional amplitudes. Our models predict two important features of rms spectra, not possible to be clearly seen by the PCA due sensitivity limits. At soft X-rays, >~3 keV, we predict the presence of a break in the rms spectrum at energy directly related to the seed photon temperature. At higher energies, ~20--30 keV, we predict a peak in the rms spectrum originating from the variability of the spectrum produced by a hybrid thermal/non-thermal electron distribution. If these features are confirmed by broad-band observations, they will impose important constraints on the origin of the seed photons for Comptonization and the electron distribution in the hot plasma.
Astrophysics
What problem does this paper attempt to address?
The problem that this paper attempts to solve is to understand the mechanism of the rapid time - varying X - ray energy spectra in black - hole X - ray binary systems. Specifically, the authors studied the relative root - mean - square (rms) variability amplitudes at different energies and attempted to explain the observed energy - dependent variability patterns through theoretical models. ### Research Background The X - ray emission in black - hole X - ray binary systems is generally considered to be produced by inverse Compton scattering, that is, cooler accretion - disk photons are scattered to higher energies in a high - temperature, optically thin plasma. Depending on the geometry of the accretion flow and the power distribution between the accretion disk and the hot plasma, various energy - spectrum distributions can be produced. These energy - spectrum distributions are manifested as different spectral states in observations. ### Research Questions 1. **Energy - Dependent Variability**: The authors studied how the energy spectra of X - ray binary systems change on time scales from milliseconds to hundreds of seconds. 2. **Theoretical Model Verification**: They constructed a theoretical model in which the X - ray energy spectrum responds to the change of a certain physical parameter, and compared these models with the rms spectra of two black - hole X - ray binaries (XTE J1550–564 and XTE J1650–500) observed by RXTE PCA. 3. **Variability Pattern Explanation**: The authors attempted to explain two main variability patterns: - In the hard state, the change in the input of seed photons. - In the soft state and the very high state, the power change of the Comptonized component. ### Key Findings - **Hard State**: The authors found that in the hard state, the rms spectrum is either flat or decreases smoothly with energy. This can be explained by changing the input of seed photons. - **Soft State and Very High State**: In these states, the rms spectrum increases with increasing energy and saturates at approximately 10 keV. This can be explained by changing the power of the Comptonized component. ### Significance By studying the energy - dependent variability, the authors hope to better understand the mechanism of rapid X - ray variability in black - hole X - ray binary systems. In addition, their model predicts some features that are difficult to clearly observe in the existing PCA data, such as the rms - spectrum break in soft X - rays (≲3 keV) and the peak at higher energies (∼20–30 keV). If these features can be confirmed in broadband observations, it will provide important constraints on understanding the origin of seed photons in the Comptonization process and the electron distribution in the hot plasma. ### Formula Examples The formulas involved in the paper include: - **Total Variance Formula**: \[ \sigma^2(E) = \sigma_s^2(E) + \sigma_h^2(E) + 2\sigma_{sh}(E) \] where \(\sigma_s^2(E)\) and \(\sigma_h^2(E)\) are the variances of the soft and hard components respectively, and \(\sigma_{sh}(E)\) is their covariance. - **Fractional rms Variability**: \[ \text{rms}(E) = \frac{\sigma(E)}{F(E)} \] where \(F(E)\) is the time - averaged flux. These formulas help the authors quantitatively describe and analyze the variability of the X - ray energy spectra.