Signatures of direct double ionization under XUV radiation

P. Lambropoulos,L. A.A. Nikolopoulos,M. G. Makris
DOI: https://doi.org/10.1103/PhysRevA.72.013410
2005-03-25
Abstract:In anticipation of upcoming two-photon double ionization of atoms and particularly Helium, under strong short wavelength radiation sources (45 eV), we present quantitative signatures of direct two-photon double ejection, in the photoelectron spectrum (PES) and the peak power dependence, that can be employed in the interpretation of related data. We show that the PES provides the cleanest signature of the process. An inflection (knee) in the laser power dependence of double ionization is also discernible, within a window of intensities which depends on the pulse duration and cross sections
Atomic Physics
What problem does this paper attempt to address?
The problem that this paper attempts to solve is the quantitative characteristics and experimental observation interpretation of the two - photon direct double - ionization process of helium atoms under a strong short - wavelength (XUV) radiation source (especially at a photon energy of 45 eV). Specifically, the author focuses on how to distinguish direct double - ionization from sequential double - ionization through specific features in the photoelectron energy spectrum (PES) and laser power dependence. ### Main problems of the paper: 1. **Differences between direct double - ionization and sequential double - ionization**: The paper explores the two - photon direct double - ionization process of helium atoms under XUV radiation and attempts to provide clear markers that can distinguish this direct process from the sequential double - ionization process. 2. **Preparation for experimental observations**: With the development of high - order harmonic generation (HOHG) technology and free - electron lasers (FEL), it is expected that sufficient intensity will be available for relevant experiments in the near future. Therefore, the paper aims to provide a theoretical basis and expected observational features for future experiments. ### Main research contents: - **Photoelectron energy spectrum (PES)**: The paper points out that PES provides the clearest characteristics of the direct double - ionization process. For example, Figure 1 shows the two - photon PES at a photon energy of 45 eV, a peak intensity of \(10^{14}\, \text{W/cm}^2\) and a pulse duration of 30 fs, where the signal generated by the direct double - ionization process is clearly different from other paths (such as single - photon ionization). - **Laser power dependence**: The paper also studies the variation of the ion yields of He⁺ and He⁺⁺ with laser power. Figure 2 shows the variation of ion yields under different direct double - ionization cross - section values, indicating that direct double - ionization is dominant at lower intensities, while sequential double - ionization gradually becomes significant at higher intensities. ### Conclusion: The main purpose of the paper is to provide theoretical support for upcoming experiments, ensuring that when experimental data are available, the direct double - ionization process can be accurately identified and interpreted. Through the features in PES and laser power dependence, researchers can better understand the mechanism of two - photon direct double - ionization and its differences from sequential double - ionization. ### Formula summary: - **Single - photon ionization cross - section**: \(\sigma_a = 2.4\times 10^{-18}\, \text{cm}^2\) - **Two - photon ionization cross - section**: \(\sigma_b = 1.0\times 10^{-53}\, \text{cm}^4\cdot \text{s}\) - **Direct double - ionization cross - section**: The estimated value of \(\sigma_2\) is between \(1\times 10^{-52}\, \text{cm}^4\cdot \text{s}\) and \(8.1\times 10^{-52}\, \text{cm}^4\cdot \text{s}\) These formulas are used to describe the probabilities and cross - sections of different ionization paths, thereby helping to interpret experimental results.