Abstract:A methodology based on small‐ and wide‐angle X‐ray scattering is proposed for simultaneously quantifying size distribution and degree of crystallinity of nanoparticles. Experimental results are shown for cubic‐like CeO2 nanoparticles.Controlling the shape and size dispersivity and crystallinity of nanoparticles (NPs) has been a challenge in identifying these parameters' role in the physical and chemical properties of NPs. The need for reliable quantitative tools for analyzing the dispersivity and crystallinity of NPs is a considerable problem in optimizing scalable synthesis routes capable of controlling NP properties. The most common tools are electron microscopy (EM) and X‐ray scattering techniques. However, each technique has different susceptibility to these parameters, implying that more than one technique is necessary to characterize NP systems with maximum reliability. Wide‐angle X‐ray scattering (WAXS) is mandatory to access information on crystallinity. In contrast, EM or small‐angle X‐ray scattering (SAXS) is required to access information on whole NP sizes. EM provides average values on relatively small ensembles in contrast to the bulk values accessed by X‐ray techniques. Besides the fact that the SAXS and WAXS techniques have different susceptibilities to size distributions, SAXS is easily affected by NP–NP interaction distances. Because of all the variables involved, there have yet to be proposed methodologies for cross‐analyzing data from two techniques that can provide reliable quantitative results of dispersivity and crystallinity. In this work, a SAXS/WAXS‐based methodology is proposed for simultaneously quantifying size distribution and degree of crystallinity of NPs. The most reliable easy‐to‐access size result for each technique is demonstrated by computer simulation. Strategies on how to compare these results and how to identify NP–NP interaction effects underneath the SAXS intensity curve are presented. Experimental results are shown for cubic‐like CeO2 NPs. WAXS size results from two analytical procedures are compared, line‐profile fitting of individual diffraction peaks in opposition to whole pattern fitting. The impact of shape dispersivity is also evaluated. Extension of the proposed methodology for cross‐analyzing EM and WAXS data is possible.

Nanoparticle size distribution estimation by full-pattern powder diffraction analysis

Proper usage of Scherrer's and Guinier's formulas in X-ray analysis of size distribution in systems of monocrystalline CeO2 nanoparticles

Implications of size dispersion on X‐ray scattering of crystalline nanoparticles: CeO2 as a case study

Strain and Grain Size Determination of CeO2 and TiO2 Nanoparticles: Comparing Integral Breadth Methods versus Rietveld, μ-Raman, and TEM

Particle sizing with spectral analysis on the transmission fluctuations

Powder Nano-Beam Diffraction in Scanning Electron Microscope: Fast and Simple Method for Analysis of Nanoparticle Crystal Structure

Uncertainty evaluation of crystallite size measurements of nanoparticle using X-Ray Diffraction analysis (XRD)

Pair distribution function and structure factor of spherical particles

Estimating grain-size distributions in nanocrystalline materials from X-ray diffraction profile analysis

Extension of Rietveld Refinement for Benchtop Powder XRD Analysis of Ultrasmall Supported Nanoparticles

Nanoparticle Size Distribution Quantification: Results of a SAXS Inter-Laboratory Comparison

A new metrology tool: using Transmission Kikuchi Diffraction (TKD) to identify and separate nanoparticles for regulatory purposes

Sampling volumes in powder diffraction experiments

Improved Method for Electron Powder Diffraction-Based Rietveld Analysis of Nanomaterials

Ab Initio Structure Solutions from Nanocrystalline Powder Diffraction Data

Quantitative powder diffraction using a (2+3) surface diffractometer and an area detector

A Comparative Study of Experimental Configurations in Synchrotron Pair Distribution Function

Atomic-Scale Structure of Nanocrystals by High-Energy X-ray Diffraction and Atomic Pair Distribution Function Analysis: Study of FexPd100-x (x = 0, 26, 28, 48) Nanoparticles

Quantitative Deviation of Nanocrystals Using the RIR Method in X-ray Diffraction (XRD)

Structural analysis of nanocrystals by pair distribution function combining electron diffraction with crystal tilting

Particle Size Distribution Measurement from Millimeters to Nanometers and from Rods to Platelets