A Model for Striped Growth

Hai Qian,Gene F. Mazenko
DOI: https://doi.org/10.1103/PhysRevE.69.011104
2003-07-30
Abstract:We introduce a model for describing the defected growth of striped patterns. This model, while roughly related to the Swift-Hohenberg model, generates a quite different mixture of defects during phase ordering. We find two characteristic lengths in the system: the scaling length L(t), and the average width of the domain walls. The growth law exponent is larger than the value of 1/2 found in typical point defect systems.
Soft Condensed Matter,Statistical Mechanics
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