Statistics of defect motion in spatiotemporal chaos in inclined layer convection

Karen E. Daniels,Eberhard Bodenschatz

DOI: https://doi.org/10.1063/1.1536330

2002-11-05

Abstract:We report experiments on defect-tracking in the state of undulation chaos observed in thermal convection of an inclined fluid layer. We characterize the ensemble of defect trajectories according to their velocities, relative positions, diffusion, and gain and loss rates. In particular, the defects exhibit incidents of rapid transverse motion which result in power law distributions for a number of quantitative measures. We examine connections between this behavior and Lévy flights and anomalous diffusion. In addition, we describe time-reversal and system size invariance for defect creation and annihilation rates.

Pattern Formation and Solitons,Chaotic Dynamics

What problem does this paper attempt to address?

The main problem that this paper attempts to solve is the research on the dipole relaxation mechanism of radiators in plasma, especially to improve and verify the current spectral line broadening models through molecular dynamics simulations. Specifically, the research aims to:

1. **Eliminate short - range Coulomb divergence**: By introducing the regularized electron - ion potential, the short - range Coulomb divergence is removed, so as to accurately describe the ion - electron interaction.
2. **Study radiator dipole relaxation**: Explore the dynamic behavior of radiators (such as ions) in plasma in an electromagnetic field, especially the dipole relaxation process. This involves describing the spectral line broadening phenomenon caused by the interaction between charged particles.
3. **Improve the spectral line broadening model**: Current spectral line broadening models are usually based on single - electron collisions and ignore the charge - charge correlation effect. This paper provides more accurate data through molecular dynamics simulations to verify and improve these models.

### Specific problem description

The paper mentions that current spectral line broadening models mainly rely on the classical quasi - particle approximation and ignore the correlation between charged particles. This simplified treatment may lead to differences from experimental results. In order to better understand these differences and improve the models, the author uses molecular dynamics simulations to study the following two aspects:

1. **The behavior of a single - ion impurity in an electron gas**: By simulating an ion impurity with infinite mass embedded in an electron gas, study the electron distribution around it and its influence on the spectral line.
2. **The behavior in a two - component plasma**: Consider a two - component plasma where electrons and ions co - exist, and study their interaction and the influence on spectral line broadening.

### Key formula

The regularized electron - ion potential used in the paper is:
\[ V_{ie}(r)=-\frac{Z e^{2}}{r}(1 - e^{-r / \delta})e^{-r / \lambda}\]
where:
- \(Z\) is the charge number of the ion.
- \(e\) is the elementary charge.
- \(r\) is the distance.
- \(\delta=(2\pi\hbar^{2}/m_{e}k_{B}T)^{1/2}\) is the de Broglie wavelength.
- \(\lambda\) is the attenuation length.

Through these studies, the author hopes to be able to provide more accurate reference data to improve the existing spectral line broadening models and provide support for future experimental and theoretical research.