Abstract:Machine learning has been widely used in diagnosing system faults as an integration part in modern intelligent manufacturing. However, sensor selection and index for machine tools are versatile and not standardized at this moment for manufacturing equipment. Without supporting of appropriate domain knowledge for selecting appropriate sensors and adequate performance index, pure data-driven approach might suffer from unsatisfied prediction accuracy and needing of excessive training data, as well as the possibility of misjudgment. As a result, a thoughtful flow for identifying key sensor index and to evaluate its impact on the performance of subsequent machine learning scheme would be essential. In this work, the status monitoring and prediction of a milling cutter wear problem is investigated as an example to address the above concerns and to demonstrate the possible solutions by hiring a 5-axis machine center equipped with milling cutters of different wear levels. In parallel, the well-used multilayer perception (MLP) artificial neural network (ANN) models are also used to elucidate the importance of the problem. Transducers including accelerometers, microphones, current transformer, and acoustic emission sensors are mounted on the spindle, fixture, and nearby structures to monitor the milling process. The collected data are processed to extract various signatures. A procedure is developed to evaluate the sensitivity of each index and the key dominated indexes are eventually identified. To elucidate the importance of proper sensor index selection, three MLP ANN models are established based on different sensor features to examine the influence of selected sensors indexes on the prediction accuracy. The results show that with appropriate sensors signatures, even with less amount of experimental data, the model can indeed achieve a better prediction (98.7%) in comparison with that without proper sensor index selection (90.3). This implies that a rigorous process for identifying key feature is essential for system diagnosis in future intelligent manufacturing.

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